发明名称 GROWING TOOL FOR THERMAL UNIFORMITY
摘要 PROBLEM TO BE SOLVED: To provide a growing tool for thermal uniformity capable of reducing variation in crystal characteristics in an epitaxial wafer by making thermal distribution of the growing tool uniformize. SOLUTION: In a tool 1, a substrate 3 is held on the surface of a tool body 2, the substrate 3 is heated by a heater 4 from the rear surface of the tool body 2 for epitaxial growth of crystal, and uneven sections 5 are formed on the rear surface of the tool body 2. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007180194(A) 申请公布日期 2007.07.12
申请号 JP20050375694 申请日期 2005.12.27
申请人 HITACHI CABLE LTD 发明人 SUKEGAWA TOSHIMITSU
分类号 H01L21/683;C23C16/458;C30B25/12;H01L21/205 主分类号 H01L21/683
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