发明名称 |
METHOD FOR FORMING MICROPATTERN IN SEMICONDUCTOR DEVICE |
摘要 |
<p>A method for forming a micro pattern of a semiconductor device is provided to restrain the deformation of the micro pattern of an etch object layer by forming the micro pattern on the etch object layer using an organic ARC(Anti-Reflective Coating) as a hard mask without additional SiON layer. An etch object layer(31) is formed on a substrate(30). An organic ARC is formed on the etch object layer. A photoresist pattern is formed on the organic ARC. An organic ARC pattern is formed on the resultant structure by etching selectively the organic ARC using the photoresist pattern as an etch mask. Then, the etch object layer is partially etched by using the organic ARC as a hard mask.</p> |
申请公布号 |
KR20070074174(A) |
申请公布日期 |
2007.07.12 |
申请号 |
KR20060001985 |
申请日期 |
2006.01.06 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, MIN SUK;LEE, JAE YOUNG |
分类号 |
H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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