发明名称 |
COMPLEMENTARY METAL OXIDE SEMICONDUCTOR IMAGE SENSOR HAVING HIGH PHOTOSENSITIVITY AND METHOD FOR FABRICATING THEREOF |
摘要 |
A CMOS(Complementary Metal Oxide Semiconductor) image sensor having high photosensitivity and a method for fabricating the same are provided to secure a light receiving area by forming a plurality of micro-pillars. A CMOS image sensor includes a light receiving element. A plurality of micro-pillars(209) are formed on an upper end of the light receiving element. Each of the micro-pillars is formed with a silicon crystal. A diameter of the micro-pillar is nano-meters and less. A method for fabricating the CMOS image sensor includes a process for preparing a semiconductor substrate(201) having a light receiving element region and a transistor region, a process for causing particles by generating plasma discharge in the light receiving element region, a process for forming the micro-pillars on the light receiving region, and a process for removing the particles.
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申请公布号 |
KR20070073430(A) |
申请公布日期 |
2007.07.10 |
申请号 |
KR20060001335 |
申请日期 |
2006.01.05 |
申请人 |
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
CHOI, YANG KYU;KIM, KUK HWAN |
分类号 |
H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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