发明名称 COMPLEMENTARY METAL OXIDE SEMICONDUCTOR IMAGE SENSOR HAVING HIGH PHOTOSENSITIVITY AND METHOD FOR FABRICATING THEREOF
摘要 A CMOS(Complementary Metal Oxide Semiconductor) image sensor having high photosensitivity and a method for fabricating the same are provided to secure a light receiving area by forming a plurality of micro-pillars. A CMOS image sensor includes a light receiving element. A plurality of micro-pillars(209) are formed on an upper end of the light receiving element. Each of the micro-pillars is formed with a silicon crystal. A diameter of the micro-pillar is nano-meters and less. A method for fabricating the CMOS image sensor includes a process for preparing a semiconductor substrate(201) having a light receiving element region and a transistor region, a process for causing particles by generating plasma discharge in the light receiving element region, a process for forming the micro-pillars on the light receiving region, and a process for removing the particles.
申请公布号 KR20070073430(A) 申请公布日期 2007.07.10
申请号 KR20060001335 申请日期 2006.01.05
申请人 KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 CHOI, YANG KYU;KIM, KUK HWAN
分类号 H01L27/146 主分类号 H01L27/146
代理机构 代理人
主权项
地址