发明名称 Methods of forming conductive contacts to source/drain regions and methods of forming local interconnects
摘要 The invention comprises methods of forming a conductive contact to a source/drain region of a field effect transistor, and methods of forming local interconnects. In one implementation, a method of forming a conductive contact to a source/drain region of a field effect transistor includes providing gate dielectric material intermediate a transistor gate and a channel region of a field effect transistor. At least some of the gate dielectric material extends to be received over at least one source/drain region of the field effect transistor. The gate dielectric material received over the one source/drain region is exposed to conditions effective to change it from being electrically insulative to being electrically conductive and in conductive contact with the one source/drain region. Other aspects and implementations are contemplated.
申请公布号 US7241705(B2) 申请公布日期 2007.07.10
申请号 US20040932218 申请日期 2004.09.01
申请人 MICRON TECHNOLOGY, INC. 发明人 BASCERI CEM;SANDHU GURTEJ S.;MANNING H. MONTGOMERY
分类号 H01L21/00;H01L21/26;H01L21/3205;H01L21/425;H01L21/44;H01L21/4763;H01L21/76 主分类号 H01L21/00
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