| 发明名称 |
Method for using internal semiconductor junctions to aid in non-contact testing |
| 摘要 |
Capacitive leadframe testing techniques are improved through knowledge of characteristics of semiconductor junctions specific to nodes of device under test (DUT) that are connected to nodes under test of the DUT.
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| 申请公布号 |
US7242198(B2) |
申请公布日期 |
2007.07.10 |
| 申请号 |
US20060478483 |
申请日期 |
2006.06.29 |
| 申请人 |
AGILENT TECHNOLOGIES, INC. |
发明人 |
SCHNEIDER MYRON J.;WILLIAMSON EDDIE |
| 分类号 |
G01R27/26;G01R31/26 |
主分类号 |
G01R27/26 |
| 代理机构 |
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