| 摘要 |
There is provided a method for a microscope device for optionally examining a sample by at least a first light beam bundle from a first direction or a second light beam bundle from a second direction different to said first direction, comprising a microscope objective and a beam deflection element, wherein the beam deflection element is operable by means of a drive in order to optionally couple the first light beam bundle or the second light beam bundle into the microscope objective, and wherein the beam deflection element is rotatable by means of the drive in order to optionally change at least an exit direction of the first light beam bundle from said beam deflection element if the first light beam bundle is coupled into the microscope objective.
|
