发明名称 HARDMASK COMPOSITION FOR LITHOGRAPHY PROCESS
摘要 <p>Provided is a composition for a hard mask of a photolithographic process, which forms an inorganic hard mask layer having an excellent etching selectivity on an organic hard mask layer so as to facilitate etching of a micropattern. The composition for an inorganic hard mask(116) comprises poly(borodiphenylsiloxane), polyvinylphenol, a crosslinking agent, a thermal acid generating agent and an organic solvent. Particularly, the crosslinking agent is a melamine-based crossliking agent, and the organic solvent is selected from the group consisting of cyclohexanone, cyclopentanone, gamma-butyrolactone and a combination thereof. The thermal acid generating agent is selected from the group consisting of 2-hdyroxyhexyl p-toluenesulfonate, 2,4,4,6-tetrabromocyclohexadienone, 2-nitrobenzyl p-toluenesulfonate, benzoin p-toluenesulfonate and a combination thereof.</p>
申请公布号 KR20070072756(A) 申请公布日期 2007.07.05
申请号 KR20060000218 申请日期 2006.01.02
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG, JAE CHANG
分类号 G03F7/039;G03F7/004 主分类号 G03F7/039
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