发明名称 METHOD OF FABRICATING A MOSFET TRANSISTOR HAVING AN ANTI-HALO FOR MODIFYING NARROW WIDTH DEVICE PERFORMANCE
摘要 <p>A method including forming a transistor structure structure comprising a gate electrode over an active region of a substrate, the active region defined by a trench isolation structure and changing a performance of a narrow width transistor with respect to a wide width transistor by introducing a dopant into the active region adjacent an interface defined by the trench isolation structure and the gate electrode. A structure including a gate electrode formed on a substrate, an active region adjacent an interface defined by a trench isolation structure and a gate electrode and an implant within the active region to change a performance of a transistor.</p>
申请公布号 WO2007075305(A1) 申请公布日期 2007.07.05
申请号 WO2006US47034 申请日期 2006.12.08
申请人 INTEL CORPORATION;CURELLO, GIUSEPPE;MUDANAI, SIVAKUMAR, P.;LINDERT, NICK;PIPES, LEONARD, C.;SHAHEED, M., REAZ;TYAGI, SUNIT 发明人 CURELLO, GIUSEPPE;MUDANAI, SIVAKUMAR, P.;LINDERT, NICK;PIPES, LEONARD, C.;SHAHEED, M., REAZ;TYAGI, SUNIT
分类号 H01L21/762 主分类号 H01L21/762
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