| 摘要 |
An apparatus and a method for detecting low frequency specular surface flaws on coated substrates is disclosed. A method for detecting low frequency specular surface flaws may comprise: impinging visible electromagnetic radiation or light from an electromagnetic radiation source via a plurality of optical fibers onto the coated substrate, reflecting the visible electromagnetic radiation off the coated substrate as a reflected image, and recording the reflected image with a photosensitive device to form a recorded image.
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