发明名称 Method for fabricating capacitor in semiconductor device
摘要 A method for fabricating a capacitor in a semiconductor device is provided. The method includes forming an insulation layer over a substrate; flushing a metal source onto the insulation layer to change a characteristic of a surface of the insulation layer to improve adherence of a metal-based material to the surface of the insulation layer; forming a storage node comprising the metal-based material over the flushed insulation layer; and sequentially forming a dielectric layer and a plate electrode over the metal-based storage node.
申请公布号 US2007148897(A1) 申请公布日期 2007.06.28
申请号 US20060448797 申请日期 2006.06.08
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YEOM SEUNG-JIN;KIL DEOK-SIN;KIM JIN-HYOCK;PARK KI-SEON;SONG HAN-SANG;ROH JAE-SUNG
分类号 H01L21/20 主分类号 H01L21/20
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