发明名称 Multi-printed etch mask process to pattern features
摘要 A method for patterning fine features using multiple jet-printed etch masks includes forming an initial feature through a first jet-printed etch mask and re-shaping the initial feature through at least one additional jet-printed etch mask.
申请公布号 US2007145002(A1) 申请公布日期 2007.06.28
申请号 US20050315713 申请日期 2005.12.22
申请人 PALO ALTO RESEARCH CENTER INCORPORATED 发明人 STREET ROBERT A.
分类号 C23F1/00;B44C1/22;C03C15/00 主分类号 C23F1/00
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