发明名称 REDUCED-RESISTANCE FINFETS AND METHODS OF MANUFACTURING THE SAME
摘要 <p>A method of manufacturing a finFET including the steps of (1) providing a substrate; and (2) forming at least one source/drain diffusion region of the finFET on the substrate. Each source/drain diffusion region includes (a) an interior region of unsilicided silicon; and (b) silicide formed on a top surface and sidewalls of the region of unsilicided silicon.</p>
申请公布号 WO2007071555(A1) 申请公布日期 2007.06.28
申请号 WO2006EP69339 申请日期 2006.12.05
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;IBM UNITED KINGDOM LIMITED;MANDELMAN, JACK, ALLAN;CHENG, KANGGUO;HSU, LOUIS, LU-CHEN;YANG, HAINING 发明人 MANDELMAN, JACK, ALLAN;CHENG, KANGGUO;HSU, LOUIS, LU-CHEN;YANG, HAINING
分类号 H01L29/786;H01L21/285;H01L21/336;H01L21/8234;H01L29/45 主分类号 H01L29/786
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