| 摘要 |
PROBLEM TO BE SOLVED: To prescribe a voltage measuring operation in using both region scan driving and phase development driving. SOLUTION: A scanning line driving circuit includes a shift register for sequentially shifting a transfer start pulse DX with a clock signal CLX and logic circuits each of which is disposed so as to correspond to each of the plurality of scanning lines and receives either one of first and second enable signals Enb1 and Enb2 and reduces a pulse width of a shift signal based on the shift register to a pulse width of the received first or second enable signal and supplies the signal to the corresponding scanning line as a scan signal. A block selection circuit includes a shift register for sequentially shifting a transfer start pulse DY with a clock signal CLY. A detection circuit outputs a signal Me for permitting a voltage measuring circuit to measure a voltage, in response to detecting that the transfer start pulse DY, the enable signal Enb1, and the transfer start pulse DX satisfy a prescribed condition. COPYRIGHT: (C)2007,JPO&INPIT
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