发明名称 Eddy current testing probe and eddy current testing apparatus
摘要 An eddy current testing probe has a flexible substrate adapted to face to a surface of a test article, a plurality of coils which are fixed to the flexible substrate and energized one of which is capable of being changed sequentially, a pressing member for pressing the substrate toward the test article, an elastic member arranged between the substrate and the pressing member, and a movement limiting member for limiting a movement of the pressing member toward the test article.
申请公布号 US7235967(B2) 申请公布日期 2007.06.26
申请号 US20060326510 申请日期 2006.01.06
申请人 HITACHI, LTD. 发明人 NISHIMIZU AKIRA;MATSUI TETSUYA;KOIKE MASAHIRO;NONAKA YOSHIO;YOSHIDA ISAO
分类号 G01R33/12 主分类号 G01R33/12
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