发明名称 |
Linear array detector system and inspection method |
摘要 |
A linear array detector (LAD) for scanning an object is provided. The detector includes a scintillator layer configured for generating a number of optical signals representative of a fraction of an incident X-ray beam passing through the object. The plane of the scintillator is parallel to the X-ray beam. The LAD further includes a two dimensional array of photo-conversion elements configured to receive several X-rays of the X-ray beams and configured to generate corresponding electrical signals. An arrangement of the photo-conversion elements is independent of the X-ray paths.
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申请公布号 |
US7236564(B2) |
申请公布日期 |
2007.06.26 |
申请号 |
US20060519271 |
申请日期 |
2006.09.12 |
申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
HOPKINS FORREST FRANK;GALISH ANDREW JOSEPH;ROSS WILLIAM ROBERT |
分类号 |
G01N23/04 |
主分类号 |
G01N23/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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