IMAGE SENSOR, AND TEST SYSTEM AND TEST METHOD FOR THE SAME

摘要

An image sensor, a test system therefor, and a test method therefor are provided to freely adjust a value of input data to be used in a test. A CIS(CMOS(Complementary Metal Oxide Semiconductor) Image Sensor)(1100) codes at least one of light and a bias voltage. An ISP(Image Signal Processing) unit(1500) converts the coded result into an image signal. The CIS(1100) has a plurality of first pixels and a plurality of second pixels. The first pixels generate the first pixel voltage in response to the light. The second pixels have the same circuit composition as the first pixels, respectively. The second pixels compensate an offset of the first pixel voltage in the first mode, and generate the second pixel voltage in response to the bias voltage in the second mode.