发明名称 METHOD AND APPARATUS FOR IMPROVED SENSITIVITY IN A MASS SPECTROMETER
摘要 <p>In a mass spectrometer, ions from an ion source pass through an inlet aperture into a vacuum chamber for transmitting prior to mass analysis by the mass analyzer. The configuration of the inlet aperture forms a sonic orifice or sonic nozzle and with a predetermined vacuum chamber pressure, a supersonic free jet expansion is created in the vacuum chamber that entrains the ions within the barrel shock and Mach disc. Once formed, an ion guide with a predetermined cross-section to essentially radially confine the supersonic free jet expansion can focus the ions for transmission through the vacuum chamber. This effectively improves the ion transmission between the ion source and the mass analyzer.</p>
申请公布号 WO2006076228(A3) 申请公布日期 2007.06.21
申请号 WO2006US00492 申请日期 2006.01.05
申请人 APPLERA CORPORATION;MDS INC.;LOBODA, ALEXANDRE, V.;COLLINGS, BRUCE, A.;COVEY, THOMAS, R.;GUNA, MIRCEA;JAVAHERI, HASSAN;SCHNEIDER, BRADLEY, B.;THOMSON, BRUCE A. 发明人 COLLINGS, BRUCE, A.;COVEY, THOMAS, R.;GUNA, MIRCEA;JAVAHERI, HASSAN;SCHNEIDER, BRADLEY, B.;THOMSON, BRUCE A.
分类号 H01J49/04;B01D59/44;H01J49/10 主分类号 H01J49/04
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