发明名称 TEST HANDLER AND SHUTTER TEST HANDLER
摘要 A test handler and a shutter for the test handler are provided to easily secure a space and to reduce the size by opening and closing an inlet or an outlet while moving a shutter member in a horizontal direction with respect to the surface where the inlet or outlet is formed. A test handler(40) is composed of a loading device loading a device loaded in a user tray to a test tray(600); a soak chamber(400A) preheating/precooling the device completely loaded in the test tray and having a receiving inlet(400a) formed at the front side to receive the test tray; a shutter(500) for opening and closing the receiving inlet of the soak chamber; a posture changing device gripping the test tray contained through the receiving inlet in the soak chamber and then changing the posture of the test tray; an input device inserting the test tray loaded by the loading device into the soak chamber through the receiving inlet; a test chamber(400B) testing the device loaded in the test tray supplied from the soak chamber; and an unloading device unloading the device completely tested in the test chamber to the user tray.
申请公布号 KR20070063904(A) 申请公布日期 2007.06.20
申请号 KR20050124225 申请日期 2005.12.15
申请人 TECHWING CO., LTD. 发明人 SHIM, JAE GYUN;NA, YUN SUNG;JEON, IN GU;KU, TAE HUNG;KIM, DOO WOO
分类号 G01R31/26;H01L21/66 主分类号 G01R31/26
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