发明名称 |
SENSORS FOR ELECTROCHEMICAL, ELECTRICAL OR TOPOGRAPHICAL ANALYSIS |
摘要 |
<p>Sensors and systems for electrical, electrochemical, or topographical analysis, as well as methods of fabricating these sensors are provided. The sensors include a cantilever and one or more probes, each of which has an electrode at its tip. The tips of the probes are sharp, with a radius of curvature of less than about 50 nm. In addition, the probes have a high aspect ratio of more than about 19:1. The sensors are suitable for both Atomic Force Microscopy and Scanning Electrochemical Microscopy.</p> |
申请公布号 |
EP1797393(A2) |
申请公布日期 |
2007.06.20 |
申请号 |
EP20050812676 |
申请日期 |
2005.09.23 |
申请人 |
THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY |
发明人 |
PRINZ, FRIEDRICH, B.;TAO, YE;FASCHING, RAINER, J.;GRECO, RALPH, S.;HAMMERICK, KYLE;SMITH, ROBERT, LANE |
分类号 |
B82B1/00;B82B3/00;G01Q10/00;G01Q60/02;G01Q60/38;G01Q60/60;H01L21/3065 |
主分类号 |
B82B1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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