发明名称 |
EXPOSURE APPARATUS CAPABLE OF WAFER RE-ALIGNMENT AND WAFER RE-ALIGNING METHOD THEREBY |
摘要 |
An exposure apparatus capable of re-aligning a wafer and a wafer re-aligning method thereof using the same are provided to re-align a wafer which is not subjected to an exposure process when an abnormal condition happens at a wafer loader. A pre-alignment unit(220) pre-aligns a wafer loaded by a robot(210). The wafer is exposed by light in a wafer stage(240). The wafer is transferred to the wafer stage by a load slider(231), and the wafer exposed by the light is transferred by an unload slider(235). A developing spinner develops the wafer exposed by the light. A buffer receptacle(270) receives a wafer rejected when an abnormal condition happens at the loading of the wafer onto the wafer stage. A wafer discerning unit(260) discerns the rejected wafers which are received in the buffer receptacle to transfer the wafers to the pre-alignment unit.
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申请公布号 |
KR20070063274(A) |
申请公布日期 |
2007.06.19 |
申请号 |
KR20050123316 |
申请日期 |
2005.12.14 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
AHN, HYUN JIN |
分类号 |
H01L21/68;H01L21/027;H01L21/677 |
主分类号 |
H01L21/68 |
代理机构 |
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