发明名称 METHOD FOR MANUFACTURING PHOTOMASK
摘要 A method for manufacturing an exposure photomask is provided to minimize an unpatterned region and therefore to be capable of producing an exposure photomask with high reliability. The method for manufacturing an exposure photomask comprises the steps of: forming a light-shielding film(102) and a photosensitive film(104) on a mask substrate(100) sequentially; removing a portion of the photosensitive film(104) on an edge of the mask substrate(100); bonding a gold wire to the light-shielding film(102) exposed in the removed portion of the photosensitive film(104) for grounding; forming photosensitive film patterns defining a region for forming light-shielding film patterns; and patterning the light-shielding film with the photosensitive film patterns as a mask.
申请公布号 KR20070063361(A) 申请公布日期 2007.06.19
申请号 KR20050123499 申请日期 2005.12.14
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, YOUNG MO
分类号 G03F1/68;G03F1/76 主分类号 G03F1/68
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