发明名称 Non-planar microelectronic device having isolation element to mitigate fringe effects and method to fabricate same
摘要 A non-planar microelectronic device, a method of fabricating the device, and a system including the device. The non-planar microelectronic device comprises: a substrate body including a substrate base and a fin, the fin defining a device portion at a top region thereof; a gate dielectric layer extending at a predetermined height on two laterally opposing sidewalls of the fin, the predetermined height corresponding to a height of the device portion; a device isolation layer on the substrate body and having a thickness up to a lower limit of the device portion; a gate electrode on the device isolation layer and further extending on the gate dielectric layer; an isolation element extending on the two laterally opposing sidewalls of the fin up to a lower limit of the gate dielectric layer, the isolation element being adapted to reduce any fringe capacitance between the gate electrode and regions of the fin extending below the device portion.
申请公布号 US2007134878(A1) 申请公布日期 2007.06.14
申请号 US20050299102 申请日期 2005.12.09
申请人 INTEL CORPORATION 发明人 BRASK JUSTIN K.;KAVALIEROS JACK T.;DOYLE BRIAN S.;CHAU ROBERT S.
分类号 H01L21/336 主分类号 H01L21/336
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