发明名称 SURFACE RESISTIVITY MEASURING DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide a surface resistivity measuring device capable of measuring accurately a surface resistivity. SOLUTION: The interval between a surface electrode 30 and a surface electrode 32 is adjusted to be the same interval as the film thickness of a measuring object film 14 as a measuring member used as a measuring object, and the surface resistivity is calculated, based on a current value of a current flowing between the surface electrode 30 and the surface electrode 32 when a voltage having a prescribed voltage value is applied between the surface electrode 30 and the surface electrode 32, the voltage value of the voltage applied between the surface electrode 30 and the surface electrode 32, and the interval between the surface electrode 30 and the surface electrode 32. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007147360(A) 申请公布日期 2007.06.14
申请号 JP20050340094 申请日期 2005.11.25
申请人 FUJI XEROX CO LTD 发明人 ICHIZAWA NOBUYUKI;SUZUKI TETSUKI
分类号 G01R27/02 主分类号 G01R27/02
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