发明名称 Wet etch processing
摘要 A method of wet etching produces high-precision microneedle arrays for use in medical applications. The method achieves precise process control over microneedle fabrication, at single wafer or batch-level, using wet etching of silicon with potassium hydroxide (KOH) solution by accurately identifying the etch time endpoint. Hence, microneedles of an exactly required height, shape, sharpness and surface quality are achieved. The outcome is a reliable, reproducible, robust and relatively inexpensive microneedle fabrication process. Microneedles formed by KOH wet etching have extremely smooth surfaces and exhibit superior mechanical and structural robustness to their dry etched counterparts. These properties afford extra reliability to such silicon microneedles, making them ideal for medical applications. The needles can also be hollowed. Wet etched silicon microneedles can then be employed as masters to replicate the improved surface and structural properties in other materials (such as polymers) by moulding.
申请公布号 US2007134829(A1) 申请公布日期 2007.06.14
申请号 US20060637020 申请日期 2006.12.12
申请人 WILKE NICOLLE;MORRISSEY ANTHONY 发明人 WILKE NICOLLE;MORRISSEY ANTHONY
分类号 H01L21/00 主分类号 H01L21/00
代理机构 代理人
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