摘要 |
PROBLEM TO BE SOLVED: To provide an electronic device having a function of checking a component mounted state and a method for checking the component mounted state, which can test the electronic device in a single state of the electronic device, without using any large-scale equipment employing a magnifying scope, X-rays or the like, nor the need, like a JTAG method, to control any peripheral functional circuit in an IC and to transmit/receive data to/from any outside computer. SOLUTION: The electronic device having the function of checking the component mounted state includes a microcomputer comprising: a general-purpose input/output port; a selector which can switch the state of an outside connecting terminal from an internal functional block to the general-purpose input/output port, and vice versa; a connecting terminal state measuring means for measuring a potential state of the outside connecting terminal while the outside connecting terminal is switched to the general-purpose input/output port; and a terminal connection state checking means for determining a connection state of the outside connecting terminal, based on a result of above measurement. A control method therefor is also provided. COPYRIGHT: (C)2007,JPO&INPIT
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