发明名称 Adjuvant for controlling polishing selectivity and chemical mechanical polishing slurry comprising the same
摘要 Disclosed is an adjuvant for use in simultaneous polishing of a cationically charged material and an anionically charged material, which forms an adsorption layer on the cationically charged material in order to increase polishing selectivity of the anionically charged material, wherein the adjuvant comprises a polyelectrolyte salt containing: (a) a mixture of a linear polyelectrolyte having a weight average molecular weight of 2,000~50,000 with a graft type polyelectrolyte that has a weight average molecular weight of 1,000~20,000 and comprises a backbone and a side chain; and (b) a basic material. CMP (chemical mechanical polishing) slurry comprising the above adjuvant and abrasive particles is also disclosed. The adjuvant comprising a mixture of a linear polyelectrolyte with a graft type polyelectrolyte makes it possible to increase polishing selectivity as compared to CMP slurry using the linear polyelectrolyte alone, and to obtain a desired range of polishing selectivity by controlling the ratio of the linear polyelectrolyte to the graft type polyelectrolyte.
申请公布号 US2007132058(A1) 申请公布日期 2007.06.14
申请号 US20060634238 申请日期 2006.12.06
申请人 YI GI R;KIM JONG P;LEE JUNG H;MOON KWANG I;KO CHANG B;JANG SOON H;CHO SEUNG B;HONG YOUNG J 发明人 YI GI R.;KIM JONG P.;LEE JUNG H.;MOON KWANG I.;KO CHANG B.;JANG SOON H.;CHO SEUNG B.;HONG YOUNG J.
分类号 H01L29/00;B24B37/00;C09K3/14;H01L21/304 主分类号 H01L29/00
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