发明名称 USE OF SEQUENTIAL CLUSTERING FOR INSTANCE SELECTION IN MACHINE CONDITION MONITORING
摘要 <p>A method is provided for selecting a representative set of training data for training a statistical model in a machine condition monitoring system. The method reduces the time required to choose representative samples from a large data set by using a nearest-neighbor sequential clustering technique in combination with akd-tree. A distance threshold is used to limit the geometric size the clusters. Each node of the kd-tree is assigned a representative sample from the training data, and similar samples are subsequently discarded.</p>
申请公布号 WO2007067521(A1) 申请公布日期 2007.06.14
申请号 WO2006US46361 申请日期 2006.12.05
申请人 SIEMENS CORPORATE RESEARCH, INC.;BALDERER, CHRISTIAN;YUAN, CHAO;NEUBAUER, CLAUS 发明人 BALDERER, CHRISTIAN;YUAN, CHAO;NEUBAUER, CLAUS
分类号 G05B17/02;G05B23/02 主分类号 G05B17/02
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