| 摘要 |
A semiconductor device test method for testing a semiconductor device is disclosed. In one embodiment, for transmitting control information to a device that is connected between a test device and the semiconductor device, a non-standard-compliant signal is sent to the device. Furthermore, the invention relates to a semiconductor device test device and a device that is, for performing a semiconductor device test method, connected between a test device and a semiconductor device to be tested.
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