| 摘要 |
An optical power control system for a semiconductor source spectroscopy system controls power fluctuations in the tunable signal (210) from the spectroscopy system (100) and thus improves the noise performance off the system. This general solution has advantages relative to other systems that simply detect reference power levels during the scan and then correct the detected signal after interaction with the sample by reducing the requirements for coordinating the operation of the sample detectors and power or reference detectors. The spectroscopy system (100) comprises a semiconductor source (200, 610, 622) and a tunable filter (612). The combination of the semiconductor source (200, 610, 622) and tunable signal (210) illuminate a sample (10) with a tunable signal (210), being tunable over a scan band (510). The power control system comprises an amplitude detector system (320, 322) for detecting the power of the tunable optical signal (210) and power control system (410, 411, 318) for regulating the amplitude of the tunable optical signal (210) in response to its detected power. |
