| 摘要 |
<p>An apparatus for optical inspection of containers (12) includes a light source(14) having at least one light emitting diode (16) with a light emitting die surface(18). Lenses and/or mirrors (20, 43) focus the light emitting die surface onto a selected portion of a container, and a light sensor (24) receives an image of the selected portion of the container illuminated by the light source. An information processor (28) is coupled to the light sensor for detecting commercial variations in the illuminated portion of the container as a function of the image received at the sensor. The image can be developed by transmission of the light energy through the selected portion of the container, and/or by reflection and/or refraction of the light energy at the selected portion of the container. The light source may include a single light emitting diode, or a plurality of light emitting diodes having light emitting die surfaces focused onto the container in such a way that the images of the light emitting die surfaces overlap and/or are adjacent to each other at the container.</p> |
