| 摘要 |
An apparatus for generating a test mode signal of a semiconductor memory device is provided to rapidly and easily perform a mounting test of the semiconductor memory device, by preparing a test mode enable pad and a test mode signal input pad on a chip and then inputting a test control signal through the test mode signal input pad. In an apparatus for generating a test mode signal of a semiconductor memory device, the semiconductor memory device is loaded on a chip. A test mode enable pad(210) is arranged on the chip, and receives a test mode enable signal. A plurality of dummy pads is arranged on the chip, and receives a test control signal. The apparatus generates a plurality of test mode signals. A test mode enable buffer(220) outputs an internal test mode enable signal by receiving a test mode enable signal from the test mode enable pad. A control signal buffer part(240) is driven by an internal test mode enable signal output from the test mode enable buffer, and includes a plurality of control signal buffers outputting an internal test control signal by receiving a test control signal from the dummy pad. A test mode decoder(250) is driven by the internal test mode enable signal and outputs a test mode signal by decoding the internal test control signal output from the control signal buffer part.
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