摘要 |
A method for augmenting quality/reliability of semiconductor units, including providing a few populations of semiconductor units that are subject to quality/reliability testing. The populations include a few quality/reliability fail candidate populations (700) and other population or populations. The method includes the step of associating test (701) flows to the populations. Each test flow includes a stress testing sequence (1200). The stress testing sequence for the quality/reliability fail candidate population includes a stress test of increased duration (806) compared to duration of a stress test in the test flow of the other population. The stress test sequence for the other population includes a stress test of increased voltage (803) compared to corresponding operating voltage specification for a semiconductor unit. The method further includes the step of applying, within a sort testing stage (201), the corresponding test flow to the populations and identifying any unit which failed (7005) the stress sequence. |