| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit capable of shortening the inspection time. SOLUTION: In a semiconductor integrated circuit 1, which is equipped with a high-frequency receiving circuit 2 for receiving high-frequency signals and a demodulator circuit 3 for demodulating the signals from the high-frequency receiving circuit 2, the demodulator circuit 3 includes a SRAM 5 and the circuit 3 also includes a SRAM for control a circuit 4 for receiving the inspection data to drive the high-frequency receiving circuit 2 and inspect from a semiconductor inspection device 27 and write in the SRAM 5 and an inspection data transmitting circuit 6 for reading inspection data to drive the high-frequency receiving circuit 2 to inspect from the SRAM 5 to transmit to the high-frequency receiving circuit 2. COPYRIGHT: (C)2007,JPO&INPIT
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