发明名称 Memory circuit arrangement for use as e.g. floating gate memory, has memory reading/verification control circuit arranged to read and/or verify condition of each memory cells of memory cell array
摘要 <p>The arrangement has a memory cell array including a set of nitrided read only memory (NROM) memory cells (102) that are arranged in rows and columns. A memory reading/verification control circuit controls a reading operation and/or verification operation on the memory cells of the array. The control circuit is arranged to read and/or verify a condition of each memory cells of the array according to reading and/or verification directive information on a memory cell level. A determination unit determines the memory cells for implementing reading and/or verification operations. An independent claim is also included for a method for reading and/or verifying a condition of memory cells of a memory cell array.</p>
申请公布号 DE102006010506(B3) 申请公布日期 2007.06.06
申请号 DE20061010506 申请日期 2006.03.07
申请人 INFINEON TECHNOLOGIES AG;INFINEON TECHNOLOGIES FLASH GMBH & CO. KG;SAIFUN SEMICONDUCTORS LTD. 发明人 COHEN, ZEEV;MAAYAN, EDUARDO;PISSORS, VOLKER
分类号 G11C16/10;G11C16/26 主分类号 G11C16/10
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