发明名称 |
Memory circuit arrangement for use as e.g. floating gate memory, has memory reading/verification control circuit arranged to read and/or verify condition of each memory cells of memory cell array |
摘要 |
<p>The arrangement has a memory cell array including a set of nitrided read only memory (NROM) memory cells (102) that are arranged in rows and columns. A memory reading/verification control circuit controls a reading operation and/or verification operation on the memory cells of the array. The control circuit is arranged to read and/or verify a condition of each memory cells of the array according to reading and/or verification directive information on a memory cell level. A determination unit determines the memory cells for implementing reading and/or verification operations. An independent claim is also included for a method for reading and/or verifying a condition of memory cells of a memory cell array.</p> |
申请公布号 |
DE102006010506(B3) |
申请公布日期 |
2007.06.06 |
申请号 |
DE20061010506 |
申请日期 |
2006.03.07 |
申请人 |
INFINEON TECHNOLOGIES AG;INFINEON TECHNOLOGIES FLASH GMBH & CO. KG;SAIFUN SEMICONDUCTORS LTD. |
发明人 |
COHEN, ZEEV;MAAYAN, EDUARDO;PISSORS, VOLKER |
分类号 |
G11C16/10;G11C16/26 |
主分类号 |
G11C16/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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