发明名称 |
DISPLAY DEVICE AND TESTING METHOD THEREOF |
摘要 |
A display device and a testing method thereof are provided to reduce fabrication cost and defective ratio of the display device by performing a VI(Visual Inspection) test on the state of a detection signal output unit for outputting a detection signal before driving IC(Integrated Circuit) are mounted on the display device. In a liquid crystal display panel assembly testing the state of a detection signal output unit(SOUT), there is provided a plurality of testing switching devices(TY1~TYN) in which input terminals and output terminals of the switching devices are connected between output data lines(OY1~OYN) and neighboring gate lines(G1~GN), respectively. There is also provided a plurality of testing switching devices(TX1~TXM) in which input terminals and output terminals of the switching devices are connected between output data lines(OX1-OXM) and neighboring data lines(D1~DM), respectively. A signal line(L1) transfers a switching-off current from a single chip(610) and a test pad(IP3) is connected to the signal line. A test line(L2) is connected to the test pad and all the control terminals of the testing switching devices(TY1~TYN). A test line(L3) is connected to all the control terminals of the testing switching devices(TX1~TXM) and is connected to the test line(L2) via a contact portion.
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申请公布号 |
KR20070056676(A) |
申请公布日期 |
2007.06.04 |
申请号 |
KR20050115652 |
申请日期 |
2005.11.30 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, MYUNG WOO;LEE, JOO HYUNG;PAK, SANG JIN;UH, KEE HAN |
分类号 |
G09G3/36;G02F1/133;G06F3/03;G09G3/20 |
主分类号 |
G09G3/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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