发明名称 PROBE DEVICE
摘要 PROBLEM TO BE SOLVED: To maintain stably contact between a probe pin and a wafer. SOLUTION: Screws 50 are provided on a plurality of spots on the peripheral part of a printed wiring board 13. Each screw 50 is screwed with a reinforcing plate 25, and penetrates the peripheral part of the printed wiring board 13. A pressing plate 60 is provided on the under face side of the peripheral part of the printed wiring board 13, and the lower end face of the screw 50 is pressed by the pressing plate 60. The pressing plate 60 is fixed to a card holder 14 through a spacer 61. A nut 51 is mounted on the upper end side of the screw 50. The peripheral part of the printed wiring board 13 is lifted by turning the screw 50 in the state where the lower end face of the screw 50 is pressed by the pressing plate 60. The height of the peripheral part of the printed wiring board 13 is adjusted by turning each screw 50 on the plurality of spots, to thereby adjust parallelism of the whole prove card 2 to the wafer. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007132846(A) 申请公布日期 2007.05.31
申请号 JP20050327462 申请日期 2005.11.11
申请人 TOKYO ELECTRON LTD 发明人 AMAMIYA TAKASHI;TSUKADA SHUICHI
分类号 G01R1/073;H01L21/66 主分类号 G01R1/073
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