| 摘要 |
The invention relates to an absolute power measurement to be made with high internal and/or external quantum efficiency to be utilised in a detector comprising at least one film layer (301 ) on a substrate (118) so forming a structure to guide radiation (?), within a wave length in a wavelength range and means (202, 203) arranged to get at least part of said radiation (?) absorbed in the detector body (118) by a conversion of the energy of said radiation photons (?3) to energy of an electrical current (h+, e") in an operation temperature (T) of the detector. The invention relates also to a method, measuring arrangement and system to be used in accordance of said detector. |
