| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a temperature detecting apparatus capable of improving temperature dependent operational characteristics, of elements in a semiconductor memory device. <P>SOLUTION: The temperature detecting apparatus includes a first oscillator that outputs a first oscillating signal in response to a first oscillator reset signal, the first oscillating signal being independent of the temperature, a second oscillator that outputs a second oscillating signal in response to a second oscillator enable signal, the second oscillating signal being dependent on the temperature, a comparator that compares an output pulse of the first oscillator with an output pulse of the second oscillator and then outputs a temperature detection comparison signal, and an output unit that outputs a temperature detection signal in response to an input of the temperature detection comparison signals. The temperature of the semiconductor memory device is detected, and a clock speed is changed by using the detected temperature. <P>COPYRIGHT: (C)2007,JPO&INPIT |
