发明名称 System for the Preferential Removal of Silicon Oxide
摘要 A system, composition, and a method for planarizing or polishing a composite substrate are provided. The planarizing or polishing system comprises (i) a polishing composition comprising (a) about 0.5 wt. % or more of fluoride ions, (b) about 1 wt. % or more of an amine, (c) about 0.1 wt. % or more of a base, and (d) water, and (ii) an abrasive. The present invention also provides a method of planarizing or polishing a composite substrate comprising contacting the substrate with a system comprising (i) a polishing composition comprising (a) about 0.5 wt. % or more of fluoride ions, (b) about 1 wt. % or more of an amine, (c) about 0.1 wt. % or more of a base, and (d) water, and (ii) an abrasive.
申请公布号 US2007120090(A1) 申请公布日期 2007.05.31
申请号 US20070620517 申请日期 2007.01.05
申请人 CABOT MICROELECTRONICS CORPORATION 发明人 MUELLER BRIAN L.;CHAMBERLAIN JEFFERY P.;SCHROEDER DAVID J.
分类号 B24B37/00;B24D3/02;C09G1/02;C09K3/14;C09K13/00;H01L21/302;H01L21/304;H01L21/306;H01L21/3105;H01L21/461 主分类号 B24B37/00
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