发明名称 PHOTOMASK AND METHOD OF FABRICATING THE SAME
摘要 A photomask and a method for the fabrication thereof are provided to prevent the capillary phenomenon from occurring so as to facilitate the resolution of a minute line width. The photomask for forming a pattern on which a plurality of patterns are arranged to be adjacent to each other comprises a transparent substrate(700); a phase shift film pattern(712) which is arranged to correspond to the plurality of patterns on the transparent substrate(700) and is formed at a pitch greater than that of the patterns on a portion that a space between the patterns is relatively broader; and a light shielding film pattern(722) which is arranged at the equal pitch to correspond to the plurality of patterns on the phase shift film pattern(712).
申请公布号 KR100725351(B1) 申请公布日期 2007.05.29
申请号 KR20050131224 申请日期 2005.12.28
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 LEE, JUN SEOK
分类号 G03F1/26;G03F1/38 主分类号 G03F1/26
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