发明名称 |
PHOTOMASK AND METHOD OF FABRICATING THE SAME |
摘要 |
A photomask and a method for the fabrication thereof are provided to prevent the capillary phenomenon from occurring so as to facilitate the resolution of a minute line width. The photomask for forming a pattern on which a plurality of patterns are arranged to be adjacent to each other comprises a transparent substrate(700); a phase shift film pattern(712) which is arranged to correspond to the plurality of patterns on the transparent substrate(700) and is formed at a pitch greater than that of the patterns on a portion that a space between the patterns is relatively broader; and a light shielding film pattern(722) which is arranged at the equal pitch to correspond to the plurality of patterns on the phase shift film pattern(712).
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申请公布号 |
KR100725351(B1) |
申请公布日期 |
2007.05.29 |
申请号 |
KR20050131224 |
申请日期 |
2005.12.28 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
LEE, JUN SEOK |
分类号 |
G03F1/26;G03F1/38 |
主分类号 |
G03F1/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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