| 摘要 |
The proposed method for determining the impedance of a microwire section consists in placing a microwire section with a known impedance into a waveguide, measuring the complex reflection index of electromagnetic radiation and the component of the complex reflection index that is induced by the scattering of high-frequency radiation modes for the said microwire section, placing the tested microwire section with unknown impedance into the waveguide, measuring the complex reflection index for the tested microwire section, and calculating the impedance of the microwire section by the value of the complex reflection index with consideration for the scattering of the high-frequency radiation modes.
|
