| 摘要 |
The proposed method of redundant measurements for determining temperature of an object by a spectral ratio using an optoelectronic measuring device consists in separating the radiation flux emitted by the object into two flux components, comparing the transfer coefficients of the measuring device at radiation wavelengths ?1 and ?2, generating radiation fluxes FX0(?1), FX(?1), F11(?1), F2(?1), FX0(?2), FX(?2), F12(?2), F2(?2) at radiation wavelengths ?1 and ?2, converting the said radiation fluxes into voltages at the output of the photodetector, generating radiation fluxes F3(?1) and F4(?1) with intensities that differ from the intensities of the radiation fluxes F2(?1) and FX(?1), converting the radiation fluxes F3(?1) and F4(?1) into voltages at the output of the photodetector, exposing the photodetector to the radiation flux FX(?1) that corresponds to the object temperature being measured, converting the radiation FX(?1) into voltage at the output of the photodetector, determining the actual intensity of the radiation flux FX(?1) from a specified equation system, generating radiation flux F2(?2) and radiation flux F3(?2) with intensity that differs from the intensity of the radiation flux F2(?2), converting the radiation fluxes F2(?2) and F3(?2) into voltages at the output of the photodetector, exposing the photodetector to the radiation flux FX0(?2), generating radiation flux F4(?2) with intensity that differs from the intensity of the radiation flux FX0(?2), and converting the radiation fluxes F4(?2) and F3(?2) into voltages at the output of the photodetector. The said direct voltages are stored and used to determine the temperature of the object from a specified equation system. The proposed method is distinctive by its extended measurement range and increased measurement accuracy.
|
