发明名称 AIR SOCKET FOR TESTING INTEGRATED CIRCUITS
摘要 An electrical component testing device comprising a housing having at least one recess covered by a flexible membrane so as to form a chamber. A fluid passage extends through a portion of the housing and connects to the chamber thus permitting passage of a fluid material into the chamber. At least one contact member is positioned on the flexible membrane so as to provide an electrical connection to an electrical contact on a device to be tested.
申请公布号 US2007113394(A1) 申请公布日期 2007.05.24
申请号 US20060614609 申请日期 2006.12.21
申请人 MICRON TECHNOLOGY, INC. 发明人 AKRAM SALMAN
分类号 H01S4/00;G01R1/04 主分类号 H01S4/00
代理机构 代理人
主权项
地址