发明名称 Friction reducing aid for CMP
摘要 The invention provides a chemical-mechanical polishing system for polishing a substrate comprising a polishing component, a water-soluble silicate compound, an oxidizing agent, and water, wherein the pH of the polishing system is about 8 to about 12. The invention further provides a method of chemically-mechanically polishing a substrate with the aforementioned polishing system. The polishing system provides for reduced friction during polishing of substrates.
申请公布号 US2007117497(A1) 申请公布日期 2007.05.24
申请号 US20050287039 申请日期 2005.11.22
申请人 CABOT MICROELECTRONICS CORPORATION 发明人 MOEGGENBORG KEVIN J.;CARTER PHILLIP W.
分类号 B24B1/00;B24B29/00;B24B37/04 主分类号 B24B1/00
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