发明名称 |
Friction reducing aid for CMP |
摘要 |
The invention provides a chemical-mechanical polishing system for polishing a substrate comprising a polishing component, a water-soluble silicate compound, an oxidizing agent, and water, wherein the pH of the polishing system is about 8 to about 12. The invention further provides a method of chemically-mechanically polishing a substrate with the aforementioned polishing system. The polishing system provides for reduced friction during polishing of substrates.
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申请公布号 |
US2007117497(A1) |
申请公布日期 |
2007.05.24 |
申请号 |
US20050287039 |
申请日期 |
2005.11.22 |
申请人 |
CABOT MICROELECTRONICS CORPORATION |
发明人 |
MOEGGENBORG KEVIN J.;CARTER PHILLIP W. |
分类号 |
B24B1/00;B24B29/00;B24B37/04 |
主分类号 |
B24B1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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