发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To suppress disconnection between a macro circuit in which a plurality of fine wirings of not more than 0.1μm are provided densely and a large-diameter lead-out wiring connected to the fine pieces of wiring of this macro circuit. SOLUTION: Three pieces M2 of wiring 103 are connected in parallel at an end of a TEG (test element group) region 101 of a lead-out wiring 102. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007129018(A) 申请公布日期 2007.05.24
申请号 JP20050319433 申请日期 2005.11.02
申请人 NEC ELECTRONICS CORP 发明人 MATSUBARA YOSHIHISA
分类号 H01L21/3205;H01L21/66;H01L23/52 主分类号 H01L21/3205
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