发明名称 X-RAY INSPECTION DEVICE
摘要 It is possible to provide an X-ray inspection device capable of accurately estimating a mass of material by eliminating the affect of various uncertain factors such as X-ray energy characteristics and a specific filter. The X-ray inspection device (10) includes a sample image capturing unit (31), an ideal curve creation unit (32), a curve adjusting unit (33), and a mass estimation unit (34) as function blocks created by a control computer (20). The sample image capturing unit (31) captures 10 X-ray transmission images of a product (G) whose actual mass is known in advance. The ideal curve creation unit (32) creates a table according to an expression indicating the relationship between the brightness and the estimated mass of the regions contained in the X-ray transmission images. The curve adjusting unit (33) references the actual mass of each inputted X-ray transmission image and adjusts the table so that the estimated mass approaches the actual mass. The mass estimation unit (34) obtains an estimated mass for each unit region according to the table after the adjustment and totals them to obtain the estimated total mass of the product (G).
申请公布号 WO2007058212(A1) 申请公布日期 2007.05.24
申请号 WO2006JP322762 申请日期 2006.11.15
申请人 ISHIDA CO., LTD.;HIROSE, OSAMU 发明人 HIROSE, OSAMU
分类号 G01B15/02;G01G9/00;G01N23/04 主分类号 G01B15/02
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