EUV ILLUMINATION SYSTEM WITH A SYSTEM FOR MEASURING FLUCTUATIONS OF THE LIGHT SOURCE
摘要
<p>The invention relates to an EUV (extreme ultraviolet) illumination system with at least one EUV light source (3) ; with an aperture stop and sensor arrangement (1) for the measurement of intensity fluctuations and/or position changes of the EUV light source (3), in particular in the range of the effectively utilized wavelengths, or of one of the intermediate images of the EUV light source (3) , wherein the aperture stop and sensor arrangement (1) includes an aperture stop (2.1) and an EUV position sensor (2.3) ; wherein the aperture stop and sensor arrangement (1) is arranged in such a way that the aperture stop (2.1) allows a certain solid angle range of the radiation originating from the EUV light source (3) or from one of its intermediate images (7) to fall on the EUV position sensor.</p>
申请公布号
WO2007054291(A1)
申请公布日期
2007.05.18
申请号
WO2006EP10725
申请日期
2006.11.09
申请人
CARL ZEISS SMT AG;SCHOLZ, AXEL;WEISS, MARKUS;MAUL, MANFRED;BOSSELMANN, PHILIPP
发明人
SCHOLZ, AXEL;WEISS, MARKUS;MAUL, MANFRED;BOSSELMANN, PHILIPP