Verfahren und Schaltkreis zur Integritätsüberwachung von Leitern in einer Anordnung von Schaltungselementen in einer Matrix,申请号DE19986037460-传众专利搜索

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发明名称	Verfahren und Schaltkreis zur Integritätsüberwachung von Leitern in einer Anordnung von Schaltungselementen in einer Matrix
摘要
申请公布号	DE69837460(D1)	申请公布日期	2007.05.16
申请号	DE19986037460	申请日期	1998.05.22
申请人	IEE INTERNATIONAL ELECTRONICS & ENGINEERING S.A.	发明人	THINNES, MARTIN
分类号	G01R31/02;B60R21/00	主分类号	G01R31/02
代理机构		代理人
主权项
地址

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