发明名称 ULTRA DENSE NON-VOLATILE MEMORY ARRAY
摘要 Twin side-by-side non-volatile memory transistors (17) have a common T-shaped control gate (57) over mirror image floating gates (53, 55) sharing a common subsurface electrode (52; 54; 56) between the floating gates. Select transistors (31, 33) on either side of the transistor pair, in combination with the common control gate (32; 34) allow selection of individual transistors in an array of rows and columns, without isolation between devices in the array. The device is made with three layers of polysilicon or poly. A first poly layer is used to form floating gates. A second poly layer is used for the T-shaped control gates. A third poly layer is used as a gate for select transistors between memory transistor pairs.
申请公布号 WO2007001713(A3) 申请公布日期 2007.05.10
申请号 WO2006US20679 申请日期 2006.05.30
申请人 ATMEL CORPORATION;LOJEK, BOHUMIL 发明人 LOJEK, BOHUMIL
分类号 H01L21/336;G11C;G11C16/04;H01L21/28;H01L21/8247;H01L27/115;H01L29/788 主分类号 H01L21/336
代理机构 代理人
主权项
地址