发明名称 DUTY CYCLE MEASURMENT CIRCUIT FOR MEASURING AND MAINTAINING BALANCED CLOCK DUTY CYCLE
摘要 A circuit and method for measuring duty cycle uncertainty in an on-chip global clock. A global clock is provided to a delay line at a local clock buffer. Delay line taps (inverter outputs) are inputs to a register that is clocked by the local clock buffer. The register captures clock edges, which are filtered to identify a single location for each edge. Imbalance in space between the edges indicated imbalance in duty cycle. Up/down signals are generated from any imbalance and passed to a phase locked loop to adjust the balance.
申请公布号 US2007103141(A1) 申请公布日期 2007.05.10
申请号 US20070619475 申请日期 2007.01.03
申请人 发明人 DIXON ROBERT C.;FRANCH ROBERT L.;RESTLE PHILLIP J.
分类号 G06M1/10;G01R31/317;G01R31/3185;G06F19/00 主分类号 G06M1/10
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